Anne-Sophie Robbes received her Ph.D. in Materials Science through research at Synchrotron SOLEIL and CEA Saclay, France. She joined CAMECA in 2012 and has held several technical and product management positions. Since 2022, she has been Semiconductor SIMS Product Manager, responsible for CAMECA’s Dynamic SIMS portfolio for semiconductor applications.
For decades, Dynamic SIMS has set the benchmark for trace-element analysis and depth profiling in semiconductor and advanced materials characterization. As analytical challenges continue to grow with increasingly complex device structures, laboratories must balance performance, reproducibility and operational efficiency.
This presentation introduces the IMS 8f, a new generation magnetic-sector Dynamic SIMS platform. Featuring a world-first automated alignment system for both primary and secondary columns, it reduces routine operator intervention and accelerates access to consistent results.
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