Two Collections are planned in collaboration with the 25th International Conference on Secondary Ion Mass Spectrometry (SIMS-25). We actively encourage you to submit the material presented at SIMS-25 to one of these two collections. We also welcome research articles related to SIMS even if they are not presented at this conference.
Papers will be peer-reviewed and must meet JVST standards for both technical content and written English. All manuscripts will be evaluated according to the same standards as regular JVST submissions.
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