Invited Speakers

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SIMS 25 Invited Speakers

★ Plenary Speakers

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TBA -Benninghoven Award 

TBA

TBAHomepage
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Andrew Ewing

Univ. of Gothenburg, Sweden

Chemical Imaging of Subcellular Organization and DynamicsHomepage
Qiuli Li

Qiuli Li

Institute of Geology and Geophysics, China

The lifespan of the MoonHomepage

★ Keynote Speakers

1. Fundamental

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Zbigniew Postawa

Jagiellonian Univ., Poland

Exploring SIMS-Related Phenomena through Recent Computer SimulationsHomepage
Matija Lagator

Matija Lagator

Rosalind Franklin Inst., UK

Water Cluster Advances for Biological SIMS: Beam Chemistry to Cryogenic ConditionsHomepage

2. Instrumentation

Jean-Nicolas Audinot

Jean-Nicolas Audinot

LIST, Luxembourg

Advancing Nanoscale Analytics: Compact Magnetic Sector SIMSHomepage
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Ian Gilmore

NPL, UK

Towards molecular volume imaging with sub-cellular resolutionHomepage
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Haiyang Li

DICP, China

Correlated Laser Ionization/ Continuous Ion beam TOF-SIMS ImagingHomepage

3. AI & Machine Learning

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John Fletcher

Univ. of Gothenburg, Sweden

Data Analysis for Biological SIMS researchHomepage

4. Earth & Env. Sci.

Hisayoshi Yurimoto

Hisayoshi Yurimoto

Hokkaido Univ., Japan

LIMAS–New horizon of noble gas cosmochemistryHomepage
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Yunbin Guan

Caltech, USA

SIMS analysis of hydrogen in nominally anhydrous mineralsHomepage

5. Materials Sci.

Xiao-Ying Yu

Xiao-Ying Yu

ORNL, USA

ToF-SIMS in energy materialsHomepage
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David Scurr

Univ. of Nottingham, UK

Molecular Insights and Origins of ICE Deposits via OrbiSIMSHomepage
Yanyan Zhang

Yanyan Zhang

ICCAS, China

In Situ Variable-Temperature Liquid SIMS for Subzero AnalysisHomepage

6. Life Sci.

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Hua Tian

Columbia Univ., USA

Deciphering the single Neuronal Death NarrativeHomepage
Tae Geol Lee

Tae Geol Lee

KRISS, Korea

Therapeutic Drug Monitoring by Nanosheet-Assisted LDI-TOFHomepage
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Haibo Jiang

HKU, China

New Insights into Lipid Trafficking from NanoSIMS ImagingHomepage

7. Industrial Applications

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Christine Mahoney

Corning, USA

What Controls Adhesion at Glass-Organic Interfaces?Homepage
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Dong Gui

TSMC, China

A new approach to quantitatively describe ion implantation profilesHomepage

8. Correlated Analysis

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Jean-Paul Barnes

CEA-LETI, France

Enabling TOF-SIMS based correlative analysisHomepage
Rita Tilmann

Rita Tilmann

Univ. Bundeswehr, Germany

Correlative SIMS techniques for semiconductor materialsHomepage

9. Atom Probe Tomography

Guido Schmitz

Guido Schmitz

Univ. Stuttgart, Germany

Mass Spectroscopy in single atom resolution: Polymers & FluidsHomepage
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Yuan Wu

USTB, China

Local ordering structure in high-entropy alloys vía APTHomepage

10. Short Course

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Satoka Aoyagi

Seikei Univ., Japan

How machine learning can improve your interpretation of SIMS dataHomepage
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Arnaud Delcorte

Univ. Catholique de Louvain, Belgium

Fundamentals of SIMSHomepage
Katie Moore

Katie Moore

Univ. of Manchester, UK

Applications of NanoSIMS in biological materialsHomepage
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Rong Hu

Nanjing Tech Univ., China

Cryogenic Atom Probe Tomography (Cryo-APT)Homepage

Sponsors

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We sincerely thank the following companies for their generous support.

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