Call for Papers

Conference Overview

We are pleased to announce the 25th International Conference on Secondary Ion Mass Spectrometry (SIMS-25), continuing the legacy of scientific excellence and international collaboration in the SIMS community. We invite researchers, engineers, and professionals to submit abstracts for oral and poster presentations.

Topics of Interest

Fundamentals

• Ion-solid Interactions
• Simulation
• Secondary Ion Formation
• Quantification
• Metrology
• Standardization

Instrumentation

• Cluster and Novel Ion Sources
• HR Imaging and Spectrometry
• 2D and 3D Approaches
• MS-MS
• OrbiSIMS
• Enhanced Ionization Methods

AI and Machine Learning

• Multivariate Analysis
• Image and 3D Data Processing
• Big Data
• Machine Learning

Earth and Environmental Sciences

• Geology
• Cosmochemistry
• Archaeology
• Cultural Heritage
• Environmental

Materials Science

• Microelectronics
• Nanostructures
• 2D Materials
• Polymers
• Energy Related Materials

Life Sciences

• Cells and Tissue Imaging
• Biomaterials
• Biotechnology

Industrial Applications

• Biological
• Inorganic
• Organic

Correlated Analysis

• Ambient MS
• MALDI
• Other MS Methods
• Multi-technique Approach

Special Session

• Atom Probe Tomography

Submission Guidelines

• Abstracts must be submitted in English via the official submission system.
• All submissions should present original research with clear results or conclusions.
• Authors must obtain approval from all co-authors and affiliated institutions.
• Poster-only submissions may be accepted after the general deadline.

Important Dates