| NO. | Beijing Time (UTC+8) | Local Time | Type | Presentation Topic | Speaker | Affiliation / Organization |
|---|---|---|---|---|---|---|
| 1 | 09:00-09:20 | 09:00-09:20 | Oral Presentation |
SIMS and XPS study of influence of the oxidizing technique on the biocompatible and corrosion properties of Ti6Al4V in a physiological environment |
Janez Kovac | Jozef Stefan Institute |
| 2 | 09:20-09:40 | 09:20-09:40 | Oral Presentation |
Elucidation of Molecular Turnover in Neural Stem Cells using SIMS: Insights into Schinzel-Giedion Syndrome and RNA Therapy |
Nhu Phan | University of Gothenburg |
| 3 | 09:40-10:00 | 09:40-10:00 | Oral Presentation |
Multimodal Correlative Imaging for Nucleic acid therapeutics |
Xu LI | The University of Hong Kong |
| 4 | 10:00-10:20 | 10:00-10:20 | Oral Presentation |
Investigating and Characterising Glycosaminoglycans in the Cancer Matrix |
Avika Srivastava | The University of Nottingham |
| 5 | 10:20-10:40 | 10:20-10:40 | Oral Presentation |
ToF-SIMS imaging of immunolabelled neuroproteins |
Clara Dieterle | Rosalind Franklin Institute |
| NO. | Beijing Time (UTC+8) | Local Time | Type | Presentation Topic | Speaker | Affiliation / Organization |
|---|---|---|---|---|---|---|
| 1 | 11:00-11:40 | 11:00-11:40 | Invited Talk |
In Situ Variable-Temperature Liquid SIMS for Subzero Analysis |
Yanyan Zhang | Institute of Chemistry, Chinese Academy of Sciences |
| 2 | 11:40-12:00 | 11:40-12:00 | Oral Presentation |
Advanced Interfacial Analysis of Composite Polymer Electrolytes – High Resolution ToF-SIMS Imaging combined with Orbitrap-SIMS |
Timo Weintraut | Justus-Liebig-University Giessen |
| 3 | 12:00-12:20 | 12:00-12:20 | Oral Presentation |
Optimising Depth Analysis for Complex Semiconductor Materials: Using Small Cluster size of Ar Cluster SIMS at High Beam Energy Under Cryogenic Conditions |
Naoko Sano | Ionoptika LTD. |
| 4 | 12:20-12:40 | 12:20-12:40 | Oral Presentation |
SIMS Across Timescales: Three Perspectives on Battery Interfacial Chemistry |
Anja Henss | Justus Liebig University Giessen |
| 5 | 12:40-13:00 | 12:40-13:00 | Oral Presentation |
An Argon Gas Cluster Ion Beam (GCIB) based ToF-SIMS approach for Ultra-Trace Lithium Profiling in microelectronic materials |
Zahraa Daher | Univ. Grenoble Alpes, CEA-Leti |
| NO. | Beijing Time (UTC+8) | Local Time | Type | Presentation Topic | Speaker | Affiliation / Organization |
|---|---|---|---|---|---|---|
| 1 | 15:00-15:40 | 15:00-15:40 | Invited Talk |
Molecular Insights and Origins of Internal Combustion Engine Deposits via OrbiSIMS |
David Scurr | University of Nottingham |
| 2 | 15:40-16:00 | 15:40-16:00 | Oral Presentation |
Refining experimental conditions for accurate SIMS characterisation of abrupt interfaces in III-V semiconductors |
Vincent Thoréton | CEA Leti |
| 3 | 16:00-16:20 | 16:00-16:20 | Oral Presentation |
Is this atom single? |
Manuela Killian | University of Siegen |
| 4 | 16:20-16:40 | 16:20-16:40 | Oral Presentation |
ToF-SIMS Investigation of Adsorption and Desorption Processes in Sur-MOF Thin Films for Environmental Water Remediation |
Maria Stefania Russo | Department of Chemical Sciences, University of Catania |
| 5 | 16:40-17:00 | 16:40-17:00 | Oral Presentation |
Multi-Modal FIB-ToF Methodologies to Address Nanoscale Characterization Challenge in Microelectronics |
Ning Zhou | Tescan China |
| 6 | 17:00-17:20 | 17:00-17:20 | Oral Presentation |
Cluster-induced desorption/ionization mass spectrometry of dye molecules - from fundamentals to OLEDs and forensic applications |
Michael Dürr | Justus Liebig University Giessen |