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  • 2026-10-29 [Thursday]
  • 2026-10-30 [Friday]
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  • A. Fundamentals
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  • H. Correlated Analysis
  • I. Special session – Atom probe tomography
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2026-10-29 (Thursday)

Tianhai Room 2 (UTC+8) 2026-10-29 Local Time

F. Life Sciences

09:00-10:40 (UTC+8) 09:00-10:40 Local Time | LIF 6-2
NO. Beijing Time (UTC+8) Local Time Type Presentation Topic Speaker Affiliation / Organization
1 09:00-09:20 09:00-09:20 Oral Presentation

SIMS and XPS study of influence of the oxidizing technique on the biocompatible and corrosion properties of Ti6Al4V in a physiological environment

Janez Kovac Jozef Stefan Institute
2 09:20-09:40 09:20-09:40 Oral Presentation

Elucidation of Molecular Turnover in Neural Stem Cells using SIMS: Insights into Schinzel-Giedion Syndrome and RNA Therapy

Nhu Phan University of Gothenburg
3 09:40-10:00 09:40-10:00 Oral Presentation

Multimodal Correlative Imaging for Nucleic acid therapeutics

Xu LI The University of Hong Kong
4 10:00-10:20 10:00-10:20 Oral Presentation

Investigating and Characterising Glycosaminoglycans in the Cancer Matrix

Avika Srivastava The University of Nottingham
5 10:20-10:40 10:20-10:40 Oral Presentation

ToF-SIMS imaging of immunolabelled neuroproteins

Clara Dieterle Rosalind Franklin Institute

E. Materials Science

11:00-13:00 (UTC+8) 11:00-13:00 Local Time | MAT 7-2
NO. Beijing Time (UTC+8) Local Time Type Presentation Topic Speaker Affiliation / Organization
1 11:00-11:40 11:00-11:40 Invited Talk

In Situ Variable-Temperature Liquid SIMS for Subzero Analysis

Yanyan Zhang Institute of Chemistry, Chinese Academy of Sciences
2 11:40-12:00 11:40-12:00 Oral Presentation

Advanced Interfacial Analysis of Composite Polymer Electrolytes – High Resolution ToF-SIMS Imaging combined with Orbitrap-SIMS

Timo Weintraut Justus-Liebig-University Giessen
3 12:00-12:20 12:00-12:20 Oral Presentation

Optimising Depth Analysis for Complex Semiconductor Materials: Using Small Cluster size of Ar Cluster SIMS at High Beam Energy Under Cryogenic Conditions

Naoko Sano Ionoptika LTD.
4 12:20-12:40 12:20-12:40 Oral Presentation

SIMS Across Timescales: Three Perspectives on Battery Interfacial Chemistry

Anja Henss Justus Liebig University Giessen
5 12:40-13:00 12:40-13:00 Oral Presentation

An Argon Gas Cluster Ion Beam (GCIB) based ToF-SIMS approach for Ultra-Trace Lithium Profiling in microelectronic materials

Zahraa Daher Univ. Grenoble Alpes, CEA-Leti
15:00-17:20 (UTC+8) 15:00-17:20 Local Time | MAT 8-2
NO. Beijing Time (UTC+8) Local Time Type Presentation Topic Speaker Affiliation / Organization
1 15:00-15:40 15:00-15:40 Invited Talk

Molecular Insights and Origins of Internal Combustion Engine Deposits via OrbiSIMS

David Scurr University of Nottingham
2 15:40-16:00 15:40-16:00 Oral Presentation

Refining experimental conditions for accurate SIMS characterisation of abrupt interfaces in III-V semiconductors

Vincent Thoréton CEA Leti
3 16:00-16:20 16:00-16:20 Oral Presentation

Is this atom single?

Manuela Killian University of Siegen
4 16:20-16:40 16:20-16:40 Oral Presentation

ToF-SIMS Investigation of Adsorption and Desorption Processes in Sur-MOF Thin Films for Environmental Water Remediation

Maria Stefania Russo Department of Chemical Sciences, University of Catania
5 16:40-17:00 16:40-17:00 Oral Presentation

Multi-Modal FIB-ToF Methodologies to Address Nanoscale Characterization Challenge in Microelectronics

Ning Zhou Tescan China
6 17:00-17:20 17:00-17:20 Oral Presentation

Cluster-induced desorption/ionization mass spectrometry of dye molecules - from fundamentals to OLEDs and forensic applications

Michael Dürr Justus Liebig University Giessen

17:20-18:00 (UTC+8) 17:20-18:00 Local Time | Sponsors Workshop 5-IONOPTIKA