- All
- 2026-10-25 [Sunday]
- 2026-10-26 [Monday]
- 2026-10-27 [Tuesday]
- 2026-10-28 [Wednesday]
- 2026-10-29 [Thursday]
- 2026-10-30 [Friday]
- All
- A. Fundamentals
- B. Instrumentation
- C. AI, Machine Learning and Data Analysis
- D. Earth and Environmental Sciences
- E. Materials Science
- F. Life Sciences
- G. Industrial Applications
- H. Correlated Analysis
- I. Special session – Atom probe tomography
- All
- Yunhai
- Tianhai Room 1
- Tianhai Room 2
- Tianhai Room 3
- Foyer
2026-10-29 (Thursday)
Tianhai Room 1 (UTC+8) 2026-10-29 Local Time
B. Instrumentation
| NO. | Beijing Time (UTC+8) | Local Time | Type | Presentation Topic | Speaker | Affiliation / Organization |
|---|---|---|---|---|---|---|
| 1 | 09:00-09:40 | 09:00-09:40 | Invited Talk |
Correlated Laser Ionization/TOF-SIMS Imaging Mass Spectrometry with Continuous C60 Ion Beam |
Haiyang Li | Dalian Institute of Chemical Physics, CAS |
| 2 | 09:40-10:00 | 09:40-10:00 | Oral Presentation |
SIMS Test Campaigns of a Novel Resonant Ion Source |
Felicien Filleul | EPFL |
| 3 | 10:00-10:20 | 10:00-10:20 | Oral Presentation |
Multi-resolution MALDI-MSI platform with Integrated MALDI-2 |
Guoxi Zhu | Maastricht University |
| 4 | 10:20-10:40 | 10:20-10:40 | Oral Presentation |
Modification of microbeam Cs ion source |
Shiro Miwa | GS Analysis |
G. Industrial Applications
| NO. | Beijing Time (UTC+8) | Local Time | Type | Presentation Topic | Speaker | Affiliation / Organization |
|---|---|---|---|---|---|---|
| 1 | 11:00-11:40 | 11:00-11:40 | Invited Talk |
Quantitative Description of Ion Implantation Profile Based on Pearson Distribution |
Dong Gui | TSMC |
| 2 | 11:40-12:00 | 11:40-12:00 | Oral Presentation |
Identifying Low-alpha Solder via Lead Isotope Fingerprint using ToF-SIMS |
Zunyu Guan | The Hong Kong University of Science and Technology (Guangzhou) |
| 3 | 12:00-12:20 | 12:00-12:20 | Oral Presentation |
Quantitative Comparison of Trace Impurities in Cu Thin Films via Oxygen-Controlled D-SIMS Analysis |
Tomomi Ohashi | ULVAC-PHI, Inc. |
| 4 | 12:20-12:40 | 12:20-12:40 | Oral Presentation |
Comprehensive SIMS Characterization for Dopant Profiling and Carrier Distribution in Wide Bandgap Semiconductor |
Hongyan Liu | Shenzhen Pinghu Laboratory |
| 5 | 12:40-13:00 | 12:40-13:00 | Oral Presentation |
Insights into chemical composition of turbocharger deposits using OrbiSIMS |
Joel Viggars | University of Nottingham |
F. Life Sciences
| NO. | Beijing Time (UTC+8) | Local Time | Type | Presentation Topic | Speaker | Affiliation / Organization |
|---|---|---|---|---|---|---|
| 1 | 15:00-15:40 | 15:00-15:40 | Invited Talk |
Therapeutic Drug Monitoring of Human Blood Samples by Using Nanosheet-Assisted LDI-TOF |
Tae Geol Lee | Korea Research Institute of Standards and Science (KRISS) |
| 2 | 15:40-16:00 | 15:40-16:00 | Oral Presentation |
Investigating changes to the glomerular filtration barrier in pregnancy and renal disease using ToF-SIMS |
Lorna Milne | University of Nottingham |
| 3 | 16:00-16:20 | 16:00-16:20 | Oral Presentation |
Pesticide analysis in Honeybee |
Akhila Ajith | University of Manchester |
| 4 | 16:20-16:40 | 16:20-16:40 | Oral Presentation |
Observing the real-time effects of PRRT therapy on patients with neuroendocrine tumors by ToF-SIMS measurements of blood serum. |
Gabriela Kanclerz | Doctoral School of Exact and Natural Sciences, Jagiellonian University, Krakow, Poland |
| 5 | 16:40-17:00 | 16:40-17:00 | Oral Presentation |
Layer by Layer: Decoding Biosensor Surface Evolution via ToF-SIMS |
marco consumi | University of Siena |
