- All
- 2026-10-25 [Sunday]
- 2026-10-26 [Monday]
- 2026-10-27 [Tuesday]
- 2026-10-28 [Wednesday]
- 2026-10-29 [Thursday]
- 2026-10-30 [Friday]
- All
- A. Fundamentals
- B. Instrumentation
- C. AI, Machine Learning and Data Analysis
- D. Earth and Environmental Sciences
- E. Materials Science
- F. Life Sciences
- G. Industrial Applications
- H. Correlated Analysis
- I. Special session – Atom probe tomography
- All
- Yunhai
- Tianhai Room 1
- Tianhai Room 2
- Tianhai Room 3
- Foyer
2026-10-27 (Tuesday)
Tianhai Room 3 (UTC+8) 2026-10-27 Local Time
I. Special session – Atom probe tomography
| NO. | Beijing Time (UTC+8) | Local Time | Type | Presentation Topic | Speaker | Affiliation / Organization |
|---|---|---|---|---|---|---|
| 1 | 11:00-11:40 | 11:00-11:40 | Invited Talk |
Mass spectroscopy in single atom resolution: Polymers & Fluids |
Guido Schmitz | Univ. of Stuttgart, Germany |
| 2 | 11:40-12:00 | 11:40-12:00 | Oral Presentation |
Atom Probe Tomography Reveals Tungsten-Mediated Atomic-Scale Stabilization of Hierarchical Microstructures in Ni-Based High-Entropy Superalloys |
Yishan Feng | South China University of Technology |
| 3 | 12:00-12:20 | 12:00-12:20 | Oral Presentation |
Influence of Atom Probe Tomography Measurement Conditions on the Compositional and Spatial Distribution Analysis of LiNi₀.₅Mn₁.₅O₄ Cathode Materials |
Feng Zhang | The Hong Kong University of Science and Technology |
B. Instrumentation
| NO. | Beijing Time (UTC+8) | Local Time | Type | Presentation Topic | Speaker | Affiliation / Organization |
|---|---|---|---|---|---|---|
| 1 | 15:00-15:40 | 15:00-15:40 | Invited Talk |
Advancing Nanoscale Analytics: Compact Magnetic Sector Spectrometer and Continuous Focal Plane Detector for Hyperspectral SIMS Imaging |
Jean-Nicolas AUDINOT | Luxembourg Institute of Science and Technology |
| 2 | 15:40-16:00 | 15:40-16:00 | Oral Presentation |
High-Resolution Magnetic Sector SIMS for Advanced Semiconductor and Materials Science Applications |
Alexander Ost | RAITH GROUP |
| 3 | 16:00-16:20 | 16:00-16:20 | Oral Presentation |
Understanding Dynamic SIMS with Magnetic‑Sector Instruments: From Fundamentals to Practical Use |
Paula Peres | CAMECA |
| 4 | 16:20-16:40 | 16:20-16:40 | Oral Presentation |
Correlative High-Resolution Surface and Mineralogical Imaging of a South American Ion-Adsorption Rare Earth Deposit Using ToF-SIMS, XPS, and Automated Mineralogy |
Gisele Azimi | University of Toronto |
