- All
- 2026-10-25 [Sunday]
- 2026-10-26 [Monday]
- 2026-10-27 [Tuesday]
- 2026-10-28 [Wednesday]
- 2026-10-29 [Thursday]
- 2026-10-30 [Friday]
- All
- A. Fundamentals
- B. Instrumentation
- C. AI, Machine Learning and Data Analysis
- D. Earth and Environmental Sciences
- E. Materials Science
- F. Life Sciences
- G. Industrial Applications
- H. Correlated Analysis
- I. Special session – Atom probe tomography
- All
- Yunhai
- Tianhai Room 1
- Tianhai Room 2
- Tianhai Room 3
- Foyer
2026-10-27 (Tuesday)
Tianhai Room 1 (UTC+8) 2026-10-27 Local Time
B. Instrumentation
| NO. | Beijing Time (UTC+8) | Local Time | Type | Presentation Topic | Speaker | Affiliation / Organization |
|---|---|---|---|---|---|---|
| 1 | 11:00-11:40 | 11:00-11:40 | Invited Talk |
Towards Molecular Volume Imaging with Sub-cellular Resolution |
Ian Gilmore | National Physical Laboratory |
| 2 | 11:40-12:00 | 11:40-12:00 | Oral Presentation |
High-energy-per-molecule O2-GCIB sputtering approach for reliable molecular depth profiling of organic-inorganic hybrid nanomaterials |
Alessandro Auditore | University of Catania |
| 3 | 12:00-12:20 | 12:00-12:20 | Oral Presentation |
Challenges and Capabilities of Dual-Beam Depth Profiling at Low Sputter Energies |
Derk Rading | IONTOF Technologies GmbH |
E. Materials Science
| NO. | Beijing Time (UTC+8) | Local Time | Type | Presentation Topic | Speaker | Affiliation / Organization |
|---|---|---|---|---|---|---|
| 1 | 15:00-15:20 | 15:00-15:20 | Oral Presentation |
Approaches to the Stability of High-Level radioactive Waste glass under coupled environments and the role of ToF-SIMS |
Jiandong Zhang | Nanjing University of Aeronautics and Astronautics |
| 2 | 15:20-15:40 | 15:20-15:40 | Oral Presentation |
ToF-SIMS Reveals How a CuAg Nanoparticle Hydrosol Inhibits Microbial Corrosion |
Lei Zhang | Institute of Metal Research, Chinese Academy of Sciences |
| 3 | 15:40-16:00 | 15:40-16:00 | Oral Presentation |
3D ToF-SIMS Investigation of Molecular-Weight-Dependent Stability in PEI-Zn Electron Transport Layers for Organic Photovoltaics |
Valerio Graziani | national institute for nuclear physics |
| 4 | 16:00-16:20 | 16:00-16:20 | Oral Presentation |
Studies and Applications of SIMS in Failure Analysis of Gate Oxide Integrity in Wafer Fabrication |
Younan Hua | Wintech Nano-Technology Services Pte Ltd |
| 5 | 16:20-16:40 | 16:20-16:40 | Oral Presentation |
Operando SIMS to Monitor Degradation in Solid-State Batteries |
Marcus Rohnke | Justus Liebig University Giessen |
| 6 | 16:40-17:00 | 16:40-17:00 | Oral Presentation |
Molecular Identification and Quantitative Analysis of Asian Lacquer Films Using ToF-SIMS |
Yeonhee Lee | Korea Institute of Science and Technology |
